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Scanning Electron and Focused Ion Beam Microscope (SEM/FIB) System
Brookhaven Science Associates, LLC (BSA), under a Prime Contract for the operation of Brookhaven National Laboratory (BNL) with the U.S. Department of Energy (DOE), herewith solicits your proposal to provide a SEM/FIB system utilizing a liquid metal ion source to produce ions for both lithography and nanoscale surface modification.
The Offeror shall fabricate, test, deliver and install a SEM/FIB system in strict accordance with Specification No. FIB-CF7606 Dated 05/06/2019. The SEM/FIB system shall contain all the hardware, software, and equipment necessary to meet the performance criteria stated therein.
Michael J. Canavan, Principal Buyer, Phone 631-344-4274, Fax 631-344-5667, Email canavan@bnl.gov
