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SOURCES SOUGHT: Two (2) Plasma Cleaning Systems for Electron/Ion Microscopes


Maryland, United States
Government : Federal
RFP
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The National Institute of Standards and Technology (NIST) seeks information on commercial vendors that are capable of providing two downstream plasma cleaning systems for removing hydrocarbons from electron/ion microscopes located in the Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility.


The NIST CNST has a requirement for two Downstream Plasma Cleaning Systems to remove hydrocarbons from the chambers of electron/ ion microscopes. These microscopes are the primary inspection tools for the NanoFab and it is important that they are working in top condition at all times. Hydrocarbon contamination is constant problem in these microscopes which reduces image quality and resolution. The problem can be eliminated by plasma cleaning the chamber, samples, and sample holders on a regular basis. The Downstream Plasma Cleaning Systems can be used to clean the microscope chamber, and specimens and specimen holders while inside the microscope chamber. A portable Plasma Cleaning System that can be easily moved from microscope to microscope without breaking vacuum is required.


Specific requirements include:


1. GENERAL REQUIREMENTS
Two downstream plasma cleaning systems are required to remove hydrocarbon contamination from electron/ion microscopes, samples and sample holders. The hydrocarbon contamination degrades microscope performance. We require plasma cleaning systems that can easily be attached and removed from an electron/ion microscope chamber, The system shall consist of a portable plasma source, control box, appropriate flanges for connection of the source to the specified microscopes, a vacuum gauge near the source and the associated cabling. The system will be used on multiple microscopes, so the appropriate valves are required to allow removal of the plasma source without affecting the vacuum inside the microscope chamber. Portable plasma cleaners that are easy to use and can be used to clean multiple microscopes with minimal interruption of operation are preferred.


2. BASE REQUIREMENTS
a. The Downstream Plasma Cleaner shall consist of a portable RF plasma source and controller that can be used on multiple microscopes.
b. The chamber pressure, RF power, and cleaning time shall be controlled and regulated by the controller.
c. The source shall attach to the microscopes with flanges/spoolers that can be permanently mounted on the microscopes.
d. A vacuum gauge is required to measure the vacuum level at the source.
e. The source must be able to ignite and run with a turbo molecular running.
f. All of the necessary cables shall be included.


3 SYSTEM ACCESSORIES
a. Flange and/or adapter options so the plasma cleaner can be used to clean a TEM.


After the results of this market research are obtained and analyzed and specifications developed for Downstream Plasma Cleaning Systems, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted will be conducted as a small business set-aside.


NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company's size classification and socio-economic status in any response to this notice.


Companies that manufacture Downstream Plasma Cleaners are requested to email a detailed report describing their abilities to paula.wilkison@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice:


1. Name of the company that manufactures the system components for which specifications are provided.


2. Name of company(s) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address).


3. Indication of number of days, after receipt of order that is typical for delivery of such systems.


4. Indication of whether each instrument for which specifications are sent to paula.wilkison@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s).


5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.


Point of Contact
Paula Wilkison, Contract Specialist, Phone (301) 975-8448, email paula.wilkison@nist.gov


Paula Wilkison, Contract Specialist, Phone 301-975-8448, Email paula.wilkison@nist.gov - Patrick K Staines, Contracting Officer, Phone (301)975-6335, Email patrick.staines@nist.gov

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